Tuesday, April 2, 2013

Formalism for electromagnetic waves

Below is described how the transfer matrix is applied to electromagnetic waves (for example light) of a given frequency propagating through a stack of layers at normal incidence. It can be generalized to deal with incidence at an angle, absorbing media, and media with magnetic properties. We assume that the stack layers are normal to the z\, axis and that the field within one layer can be represented as the superposition of a left- and right-traveling wave with wave number k\,,

E(z) = E_r e^{ikz} + E_l e^{-ikz}\,.

Because it follows from Maxwell's equation that E\, and F=dE/dz\, must be continuous across a boundary, it is convenient to represent the field as the vector (E(z),F(z))\,, where

F(z) = ik E_r e^{ikz} - ik E_l e^{-ikz}\,.

Since there are two equations relating E\, and F\, to E_r\, and E_l\,, these two representations are equivalent. In the new representation, propagation over a distance L\, into the positive z\, direction is described by the matrix

M = \left( \begin{array}{cc} \cos kL & \frac{1}{k} \sin kL \\ -k \sin kL & \cos kL \end{array} \right),

and

\left(\begin{array}{c} E(z+L) \\ F(z+L) \end{array} \right) =
   M\cdot  \left(\begin{array}{c} E(z) \\ F(z) \end{array} \right)

Such a matrix can represent propagation through a layer if k\, is the wave number in the medium and L\, the thickness of the layer: For a system with N\, layers, each layer j\, has a transfer matrix M_j\,, where j\, increases towards higher z\, values. The system transfer matrix is then

M_s = M_N \cdot \ldots \cdot M_2 \cdot M_1.

Typically, one would like to know the reflectance and transmittance of the layer structure. If the layer stack starts at z=0\,, then for negative z\,, the field is described as

E_L(z) = E_0 e^{ik_Lz} + r E_0 e^{-ik_Lz}\,,

where E_0\, is the amplitude of the incoming wave, k_L\, the wave number in the left medium, and r\, is the amplitude (not intensity!) reflectance coefficient of the layer structure. On the other side of the layer structure, the field consists of a right-propagating transmitted field

E_R(z) = t E_0 e^{ik_R z}\,,

where t\, is the amplitude transmittance and k_R\, is the wave number in the rightmost medium. If F_L = dE_L/dz\, and F_R = dE_R/dz\,, then we can solve

\left(\begin{array}{c} E(z_R) \\ F(z_R) \end{array} \right) =
   M\cdot \left(\begin{array}{c} E(0) \\ F(0) \end{array} \right)

in terms of the matrix elements M_{mn}\, of the system matrix M_s\, and obtain

t = 2 i k_L e^{-i k_R L}\left[\frac{M_{11} M_{22} - M_{12} M_{21}}{-M_{21} + k_L k_R M_{12} + i(k_R M_{11} + k_L M_{22})}\right]

and

r = \left[\frac{ (M_{21} + k_L k_R M_{12}) + i(k_L M_{22} - k_R M_{11})}{(-M_{21} + k_L k_R M_{12}) + i(k_L M_{22} + k_R M_{11})}\right].

The transmittance and reflectance (i.e., the fractions of the incident intensity \left|E_0\right|^2 transmitted and reflected by the layer) are often of more practical use and are given by T=|t|^2\, and R=|r|^2\,, respectively.

[edit] Example


As an illustration, consider a single layer of glass with a refractive index n and thickness d suspended in air at a wave number k (in air). In glass, the wave number is k'=nk\,. The transfer matrix is

M=\left(\begin{array}{cc}\cos k'd & \sin(k'd)/k' \\ -k' \sin k'd & \cos k'd \end{array}\right).

The amplitude reflection coefficient can be simplified to

r = \frac{(1/n - n) \sin k'd}{(n+1/n)\sin k'd  + 2 i \cos(k'd)}.

This configuration effectively describes a Fabry–Pérot interferometer or etalon: for k'd=0, \pi, 2\pi, \cdots\,, the reflection vanishes.

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